SEC X-eye SF160ACT

Brochure

SF160ACT is a high-resolution micro-focus X-ray system for the inspection of semiconductor, PCB assembly, and electronic component. With its superior X-ray imaging, micro-scale hidden defects can be detected in high resolution.

SF160ACT equips 160kV micro-focus open tube with 1um spot size. The system can magnify the object up to 4,800x and display the X-ray image at any angle using 6-axis manipulator configuration.

 

 

 

 

 

 

 

 

 

3D CT(Computed Tomography) visualizes all hidden structure and even micro-scale defects inside the object. SEC unique oblique CT technology realizes high-magnified 3D CT visualization of large sample. Generally, it is known that CT scanning is limited by the object size, but oblique CT technology overcomes the size limitation and can be adapted to PCB assemblies, large-size Multilayer boards and even to semiconductor wafers.

 

 

 

 

 

 

 

 

 

Key specifications:

  • 160kV Micro-focus X-ray Open Tube with 1 micron focal spot size
  • 460mm x 510mm Table Size with full enhanced stroke axis (X,Y,Z,T,R)
  • Max. Magnification up to 4,800x
  • Up to 60° oblique with AFTTM Function
  • Unparallel User-friendly Interface with various tools
  • Optional micro-CT module
  • Automatic BGA Inspection Module

CT Features:

  • GPU Based Fast CT recon. time of <10sec
  • Min. Voxel size of <5um
  • Max. 20483 3D recon. matrix
  • Easy CT software configuration
  • Unlimited Oblique Slice / Unlimited level Oblique View
  • VR with cut plane, MIP, MPR
  • 3D Measurement with Analysis Features
  • 3D Zoom
  • Report Function

 

 

 

 

 

 

 

 

 

 

 

 

Video link: http://www.youtube.com/watch?v=sjfyp9HVJPo

Filter products:
Products in this category::
logos